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Dealing with early life failures

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1 Author(s)
Kwang-Ting Tim Cheng ; University of California, Santa Barbara

D&T editor in chief Tim Cheng discusses the industry's struggle to screen latent defects for complex ICs. He also welcomes two new editors to the D&T editorial board.

Published in:

Design & Test of Computers, IEEE  (Volume:23 ,  Issue: 2 )