By Topic

Spectroscopic performance of the DePMOS detector/amplifier device with respect to different filtering techniques and operating conditions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

17 Author(s)
M. Porro ; Dipt. di Ingegneria Nucleare, Politecnico di Milano, Milan, Italy ; G. Ferrari ; P. Fischer ; O. Halker
more authors

A DePMOS structure provides detection and amplification jointly, and it is free of interconnection stray capacitance. To fully exploit the intrinsic low noise of the device an electrical model has been developed. The most relevant parameters have been measured in order to choose an adequate readout electronics. DePMOS can operate in continuous mode, i.e., without applying any clear pulse during the signal processing, and can be read out by a time-continuous shaper amplifier. An unequalled noise of 2.2 electrons rms at room temperature has been measured. In this mode DePMOS can be used, for example, as the readout device for silicon drift detectors. Anyway , DePMOS was developed to be the basic element of an active pixel sensor suitable to cope with the requirements of the XEUS Wide Field Imager. In a matrix arrangement, each pixel must be read out by a time-variant filter. A multichannel integrated shaping amplifier, based on multicorrelated double sampling, has been designed. Spectroscopic resolution obtained filtering the pixel matrix with this readout chip is in agreement with measurements in continuous mode and matches the predictions of the model presented. It has also been experimentally proved that the clear procedure does not introduce additional noise contribution, even in the very low noise range achieved. This qualifies DePMOS as a "reset-noise-free" device

Published in:

IEEE Transactions on Nuclear Science  (Volume:53 ,  Issue: 1 )