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Statistics of single-electron signals in electron-multiplying charge-coupled devices

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3 Author(s)
T. Plakhotnik ; Sch. of Phys. Sci., Univ. of Queensland, Brisbane, Qld., Australia ; A. Chennu ; A. V. Zvyagin

Electron-multiplying charge coupled devices promise to revolutionize ultrasensitive optical imaging. The authors present a simple methodology allowing reliable measurement of camera characteristics and statistics of single-electron events, compare the measurements to a simple theoretical model, and report camera performance in a truly photon-counting regime that eliminates the excess noise related to fluctuations of the multiplication gain.

Published in:

IEEE Transactions on Electron Devices  (Volume:53 ,  Issue: 4 )