By Topic

Digital background calibration for memory effects in pipelined analog-to-digital converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Keane, J.P. ; Dept. of Electr. & Comput. Eng., Univ. of California, Davis, CA ; Hurst, P.J. ; Lewis, S.H.

Memory errors can occur in the stages of a pipelined analog-to-digital converter (ADC) due to several effects. These include capacitor dielectric absorption/relaxation, incomplete stage reset at high clock rates, and parasitic capacitance effects when opamps are shared between subsequent pipeline stages. This paper describes these sources of memory errors and the effect they have on overall ADC linearity. It is shown how these errors relate to and differ from interstage gain errors. Two new calibration algorithms are proposed that correct for memory errors by digital post-processing of the ADC output. Both algorithms operate in the background and so do not require conversion to be interrupted in order to track changes due to temperature and supply variations. The two algorithms are compared in terms of their system costs and their dependence on input signal statistics

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:53 ,  Issue: 3 )