Cart (Loading....) | Create Account
Close category search window
 

Extracting geometrical information of closely packed random media from multiply scattered light via a cross-correlation analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

We have implemented a two-dimensional (2-D) pseudospectral time-domain (PSTD) numerical solution of Maxwell's equations to calculate the total scattering cross-section (TSCS) spectrum of a macroscopic, closely packed, random medium consisting of dielectric cylinders. Results reported in this letter show that a TSCS spectral signature is identified, revealing structural information of the random medium. Furthermore, by means of the proposed cross-correlation analysis, the diameter of constituent cylinders within a closely packed cluster can be determined. On a broader perspective, based on first principles, our research findings may lead to a better understanding of the coherent interference effect of light scattering by closely packed random media. Specifically, we show that, microscopic structural information of the random medium can be determined from the forward, multiply scattered light, even for optically thick , closely packed random media, with scatterers spaced less than a single wavelength apart.

Published in:

Antennas and Wireless Propagation Letters, IEEE  (Volume:5 ,  Issue: 1 )

Date of Publication:

Dec. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.