Scheduled System Maintenance:
On May 6th, system maintenance will take place from 8:00 AM - 12:00 PM ET (12:00 - 16:00 UTC). During this time, there may be intermittent impact on performance. We apologize for the inconvenience.
By Topic

Design and calibration of appropriate connector qualification/reliability tests

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
1 Author(s)
Sproles, E.S., Jr. ; AT&T Bell Lab., Columbus, OH, USA

Summary form only given. Timely development of information on connector reliability requires development of calibrated, relevant laboratory tests. Development of such tests for connectors requires an understanding of the failure mechanisms active in a connector system. It is the goal of the test designer to think of all the things that might go wrong with the connector, and to design and calibrate appropriate tests to quantify their impact on the connector. Clearly, this problem is so complex that this goal is rarely achieved, and any practical test program will always include some arbitrariness. The author presents what is known about a number of failure mechanisms and discusses how to develop a rational test program to evaluate connector performance.<>

Published in:

Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on

Date of Conference:

26-29 Sept. 1988