By Topic

State/noise estimator for descriptor systems with application to sensor fault diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Zhiwei Gao ; Dept. of Autom., Tianjin Univ., China ; D. W. C. Ho

For descriptor systems with measurement output noises (input disturbances may exist at the same time), a new descriptor estimator technique is developed. The necessary and sufficient condition for the existence of the present estimator is derived, and a systematic design approach is addressed. The effect of uncertainties is decoupled completely, and the asymptotic estimates of the descriptor system state and the output noise are obtained simultaneously. Furthermore, a normal state/disturbance estimator is also given. For a class of nonlinear descriptor systems with both output noises and input uncertainties, a nonlinear descriptor estimator is derived by using the proposed design approach, together with the linear matrix inequality technique. The existence and convergence of the nonlinear descriptor estimator is proven. The asymptotic estimates of the descriptor nonlinear system state and the output noise are obtained at the same time. The present estimators are applied to the sensor fault diagnosis, and hence the sensor fault can be estimated asymptotically. Finally, two numerical examples are included to illustrate the proposed design procedures and applications.

Published in:

IEEE Transactions on Signal Processing  (Volume:54 ,  Issue: 4 )