Dynamic modeling of a magnetic system constructed with giant magnetostrictive thin film using element-free galerkin method

A dynamic model of electromagnetic devices constructed with magnetostrictive thin film is developed to study the dynamic characteristics of the system. In the developed model, the inductance is considered as current and geometry dependent so as to represent the magneto-elastic property of the magnetostrictive thin film. Such an inductance is obtained from coupled magnetoelastic field solutions. Element-free Galerkin method (EFGM) is adopted in numerical field analysis so as to describe the magnetostrictive thin film; the /spl Delta/E effect is considered to improve the material property modeling. The developed simulation model is examined through comparing the simulated current-voltage characteristic with the measured one.