By Topic

Investigation on the Gaussian beam scattering from non-Gaussian random rough surface

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Guo Li-Xin ; Sch. of Sci., Xidian Univ., Xi''an, China ; Ren Yu-chao

In this paper, gamma function with different order K is introduced to characterize the PDF of rough surface. Using the unified full wave approach, the backscattering cross-sections of different polarizations are compared for the surfaces with gamma and Gaussian distribution. Base on the previous investigation on the surface scattering with the plane wave incidence, this study extends to Gaussian beam fields excited by 2-D aperture field distributions, which is assumed incident upon a 2-D dielectric rough surface. It is shown that provided the linear dimension of the rough surface is large compared with the surface height correlation length, the results obtained are close to those of the plane wave incidence.

Published in:

Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings  (Volume:4 )

Date of Conference:

4-7 Dec. 2005