By Topic

A Ratiometric Method for Oxygen Measurement Using a Luminescent Sensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
M. Valledor ; Universidad de Oviedo, Dpto. de Ingenieria Electrica, Electronica, Computadores y Sistemas. Edificio Departamental n°3, Campus de Viesques s/n, 33204 Gijon, SPAIN ; J. C. Campo ; F. J. Ferrero ; J. C. Viera
more authors

A great variety of methods for oxygen sensing using luminescent sensors have been proposed in recent years based on intensity or in lifetime quenching. Like lifetime measurements, ratiometric techniques are insensitive to the variations of the excitation light, optical path and photo-bleaching. In this work, we present a ratiometric method based on the phosphorescence-fluorescence spectral overlap emission of a phosphorescent chemical sensor. This dual emission makes ratiometric measurements possible without need of adding a reference luminophore. The ratio is calculated by measuring the phase shift between the excitation and the emission signal at two different frequencies. Theoretical aspects of the proposed methodology and the design and construction of a fiber-optical measuring system are discussed. Finally, the performance of the proposed measurement method has been assessed using the metal chelate Al-Ferron immobilized in an inorganic sol-gel support (an oxygen indicator which displays a strong fluorescence emission overlapping significantly with the measured phosphorescence emission)

Published in:

2005 IEEE Instrumentationand Measurement Technology Conference Proceedings  (Volume:2 )

Date of Conference:

16-19 May 2005