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Using Multisines to Measure State-of-the-Art Analog to Digital Converters

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4 Author(s)
Rabijns, D. ; Dept. ELEC/TW, Vrije Univ. Brussel, Brussels ; Van Moer, W. ; Vandersteen, G. ; Schoukens, J.

Multisines have proven to be very useful for fast and accurate measurements, especially when studying the nonlinear behavior of a device under test (DUT). However, in most papers, they are applied to an analog DUT. This paper deals with some problems that can arise when designing experiments for measuring state-of-the-art analog to digital converters (ADCs) with multisines. It will be explained that special care has to be taken with the measurement setup, especially with the generation and verification of the test signals. By means of real measurement examples, it will be shown that most techniques used for analog measurements can still be used, but must be adapted to the new proposed measurement setup

Published in:

Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE  (Volume:1 )

Date of Conference:

16-19 May 2005

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