By Topic

Using Multisines to Measure State-of-the-Art Analog to Digital Converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
D. Rabijns ; Vrije Universiteit Brussel (Dept. ELEC/TW); Pleinlaan 2; B-1050 Brussels (Belgium). Phone +32.2.629.29.79; Fax: +32.2.629.28.50 Email: ; W. Van Moer ; G. Vandersteen ; J. Schoukens

Multisines have proven to be very useful for fast and accurate measurements, especially when studying the nonlinear behavior of a device under test (DUT). However, in most papers, they are applied to an analog DUT. This paper deals with some problems that can arise when designing experiments for measuring state-of-the-art analog to digital converters (ADCs) with multisines. It will be explained that special care has to be taken with the measurement setup, especially with the generation and verification of the test signals. By means of real measurement examples, it will be shown that most techniques used for analog measurements can still be used, but must be adapted to the new proposed measurement setup

Published in:

2005 IEEE Instrumentationand Measurement Technology Conference Proceedings  (Volume:1 )

Date of Conference:

16-19 May 2005