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Optimal diagnostic methods for wiring interconnects

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3 Author(s)
Cheng, W.-T. ; AT&T Bell Lab., Princeton, NJ, USA ; Lewandowski, J.L. ; Wu, E.

The problem of generating minimum test sets for diagnosing faults in wiring interconnects on printed circuit boards is addressed. It is assumed that all the nets can be accessed in parallel or through a boundary-scan chain on the board. The fault model includes multiple stuck-at-hand faults. Three methods for three different diagnosis mechanisms are presented. All the diagnostic methods can be further improved by taking advantage of the structural information of wiring interconnects

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:11 ,  Issue: 9 )