Cart (Loading....) | Create Account
Close category search window

Silicon carbide pin diodes as radiation detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)

We have tested the radiation detection performance of silicon carbide (SiC) pin diodes originally developed as high power diodes. These devices consist of 100 micron thick 4H-SiC grown epitaxially on SiC substrates. We measured the absolute charge generated by X-rays per keV in SiC by comparing the charge generation with similar silicon devices and determined the energy required per electron hole pair in SiC to be 7.6 eV. Small devices with a diameter of 1 mm were tested and produced spectra with a room temperature energy resolution of-550 eV at 60 keV, which is consistent with the electronics limit for the capacitance of the device. This allowed us to put an upper limit to the Fano factor of 0.04. We also performed radiation damage tests on these devices and found no significant loss in charge collection up to a photon dose of 100 MRad. Applications for these devices can be found in the fields of particle physics, nuclear physics, nuclear medicine, X-ray fluorescence, X-ray astronomy and X-ray navigation

Published in:

Nuclear Science Symposium Conference Record, 2005 IEEE  (Volume:3 )

Date of Conference:

23-29 Oct. 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.