Cart (Loading....) | Create Account
Close category search window

Electrical Conduction in Metallic Nanotubes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Anantram, M.P. ; Center for Nanotechnology, NASA Ames Res. Center, Moffett Field, CA ; Svizhenko, A. ; Mehrez, H.

In this talk, the authors discuss their effort in modeling charge transport (1) in a single nanotube coupled to contacts (intra-nanotube transport) and (2) across multiple nanotubes representative of a simplified fiber (inter-nanotube transport). Accurate modeling of transport in these systems is intrinsically quantum mechanical because it is essential to model tunneling, even in metallic nanotubes. The computational model involves self-consistently solving the nonequilibrium Green's function and Poisson equations, with electron-phonon interaction. To model inter-nanotube transport, the authors also find it essential to use molecular dynamics and density function theory based methods to generate the accurate atomic structure of a multiple nanotube system

Published in:

Semiconductor Device Research Symposium, 2005 International

Date of Conference:

7-9 Dec. 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.