Referenced Items are not available for this document.
The design of compact noise detector circuitry that could be embedded and arrayed within a high-density large-scale digital circuit was demonstrated. In-depth characterization of dynamic power-supply and ground noises by the built-in noise detection technique can validate and/or calibrate dynamic power-supply analysis (IR drop) methodologies that are becoming requisite to nanometer scale digital integrated circuits.
Published in:
Design Automation, 2006. Asia and South Pacific Conference on
Date of Conference: 24-27 Jan. 2006
- Print ISBN:
- 0-7803-9451-8
- INSPEC Accession Number:
- 8894586
- Digital Object Identifier :
- 10.1109/ASPDAC.2006.1594659
- Product Type:
- Conference Publications
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