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A built-in power supply noise probe for digital LSIs

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4 Author(s)
Fukazawa, M. ; Dept. of Comput. & Syst. Eng., Kobe Univ., Japan ; Noguchi, K. ; Makoto Nagata, ; Taki, K.

The design of compact noise detector circuitry that could be embedded and arrayed within a high-density large-scale digital circuit was demonstrated. In-depth characterization of dynamic power-supply and ground noises by the built-in noise detection technique can validate and/or calibrate dynamic power-supply analysis (IR drop) methodologies that are becoming requisite to nanometer scale digital integrated circuits.

Published in:

Design Automation, 2006. Asia and South Pacific Conference on

Date of Conference:

24-27 Jan. 2006