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Analysis of reliability in nanoscale circuits and systems based on a-priori statistical fault-modeling methodology

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3 Author(s)
Stanisavljevic, M. ; Swiss Fed. Inst. of Technol., Lausanne ; Schmid, A. ; Leblebici, Y.

This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete Monte Carlo based tool for a-priori functional fault tolerance analysis was developed, that induces different failure models, and does subsequent evaluation of system reliability under realistic constraints. A structured fault modeling architecture is also proposed, which is together with the tool a part of the new reliability design method representing a compatible improvement of existing IC design methodologies

Published in:

Circuits and Systems, 2005. 48th Midwest Symposium on

Date of Conference:

7-10 Aug. 2005