By Topic

Nonchemical dielectric barrier discharge treatment as a method of insect control

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Bures, B.L. ; Alameda Appl. Sci. Corp., San Leandro, CA, USA ; Donohue, K.V. ; Roe, R.M. ; Bourham, M.A.

The spread of insects due to trade of agricultural commodities and travel of humans is a significant problem in many countries. Limiting the movement of pest species is commonly achieved by the use of chemical pesticides. Concerns about resistance to insecticides, as well as their environmental impact has stimulated an evaluation of alternative pest control methods. Nonchemical dielectric barrier discharge (DBD) treatment of insects in a low electron density (106-108 cm-3), low electron temperature (1-2 eV) discharge has proven effective in significantly reducing the population of selected insects. The insects are directly exposed to a wide gap (>3 cm) helium discharge with average power densities on the order of 60 mW/cm3. Direct measurement of chemical species and ambient gas temperature shows the DBD treatment remains effective when the chemically reactive species are suppressed by helium, and when the ambient gas temperature of the discharge is below 40°C. However, the treatment is more rapid when the ambient gas temperature is elevated. The study has shown the treatment does not always induce instant mortality: however, the mortality increases over a 24-h period after treatment.

Published in:

Plasma Science, IEEE Transactions on  (Volume:34 ,  Issue: 1 )