By Topic

Design Study of A New Beam Separator for PEEM3

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wan, W. ; LBNL Berkeley, CA 94720, USA ; Feng, J. ; Padmore, H.A.

Aberration correction of photoemission electron microscopes (PEEM) requires use of a magnetic beam separator. This device is a complex integrated magnetic system and is essentially fixed in its optical properties hence very susceptible to problems caused by mechanical or magnetic imperfections. Here we present a separate function design that is simple to construct, is fully adjustable and gives outstanding performance.

Published in:

Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the

Date of Conference:

16-20 May 2005