By Topic

Flicker noise in high-speed p-i-n photodiodes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
E. Rubiola ; Centre Nat. de la Recherche Scientifique, Univ. de Franche Comte, Besancon, France ; E. Salik ; Nan Yu ; L. Maleki

The microwave signal at the output of a photodiode that detects a modulated optical beam contains the phase noise α(t) and amplitude noise α(t) of the detector. Beside the white noise, which is well understood, the spectral densities Sψ(f) and Sα(f) show flicker noise proportional to 1/f. We report on the measurement of the phase and amplitude noise of high-speed p-i-n photodiodes. The main result is that the flicker coefficient of the samples is ∼10-12 rad2/Hz (-120 dBrad2/Hz) for phase noise, and ∼10-12 Hz-1 (-120 dB) for amplitude noise. These values could be observed only after solving a number of experimental problems and in a protected environment. By contrast, in ordinary conditions, insufficient electromagnetic interference isolation, and also insufficient mechanical isolation, are responsible for additional noise to be taken in. This suggests that if package and electromagnetic compatibility are revisited, applications can take the full benefit from the surprisingly low noise of the p-i-n photodiodes.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:54 ,  Issue: 2 )