By Topic

Data analysis of the extraction of dielectric properties from insulating substrates utilizing the evanescent perturbation method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
R. Inoue ; Tonouchi Lab., Osaka Univ., Japan ; Y. Odate ; E. Tanabe ; H. Kitano
more authors

The evanescent perturbation technique utilizing open-ended coaxial resonator probes was investigated as a nondestructive method for measuring the dielectric properties of insulating substrates in the microwave frequency region. As an investigative result, we have proposed a new formulaic method of data analysis by which the complex permittivity of samples, from changes in resonant frequency (f) and the quality factor of the resonance (Q), may be extracted in a concise and highly reproducible manner. The proposed formula has been developed based upon experimentation and detailed numerical studies of full-wave Maxwell equations coupled with physical observation and interpretation of experimental data. The new formula is applicable to both bulk and film samples with zero and finite tip-sample distances. The geometric factors derived were analyzed for variable parameters such as tip curvature, sample thickness, and tip-sample distance. Additionally, the calibration procedures necessary for experimental determination of these geometric factors were established.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:54 ,  Issue: 2 )