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Radiation-induced multi-bit upsets in SRAM-based FPGAs

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5 Author(s)
Quinn, H. ; Space Data Syst., Los Alamos Nat. Lab., NM, USA ; Graham, P. ; Krone, J. ; Caffrey, M.
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This paper provides a methodology for estimating the proton and heavy ion static saturation cross-sections for multi-bit upsets (MBUs) in Xilinx field-programmable gate arrays and describes a methodology for determining MBUs' effects on triple-modular redundancy protected circuits. Experimental results are provided.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:52 ,  Issue: 6 )

Date of Publication:

Dec. 2005

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