Referenced Items are not available for this document.
This paper provides a methodology for estimating the proton and heavy ion static saturation cross-sections for multi-bit upsets (MBUs) in Xilinx field-programmable gate arrays and describes a methodology for determining MBUs' effects on triple-modular redundancy protected circuits. Experimental results are provided.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:52
,
Issue:
6
)
Date of Publication: Dec. 2005
- Page(s):
- 2455 - 2461
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 8767947
- Digital Object Identifier :
- 10.1109/TNS.2005.860742
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 February 2006
- Issue Date :
- Dec. 2005
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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