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New methodology for combined Simulation of delta-I noise interaction with interconnect noise for wide, on-chip data-buses using lossy transmission-line power-blocks

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5 Author(s)
A. Deutsch ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; H. H. Smith ; B. J. Rubin ; B. L. Krauter
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A new technique is described for reducing computational complexity and improving accuracy of combined power distribution and interconnect noise prediction for wide, on-chip data-buses. The methodology uses lossy transmission-line power-blocks with frequency-dependent properties needed for the multigigahertz clock frequencies. The interaction between delta-I noise, common-mode noise, and crosstalk and their effect on timing is illustrated with simulations using representative driver and receiver circuits and on-chip interconnections.

Published in:

IEEE Transactions on Advanced Packaging  (Volume:29 ,  Issue: 1 )