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Distributed constant passive devices using wafer-level chip scale package technology for one-chip wireless communication circuits

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8 Author(s)
J. Seita ; Integrated Res. Inst., Tokyo Inst. of Technol., Yokohama, Japan ; H. Ito ; H. Sugita ; K. Okada
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Large losses of on-chip passive devices are crucial problem for CMOS RF circuits. This paper proposes the use of wafer-level chip scale package (WL-CSP) technology to realize on-chip distributed-constant passive devices on Si CMOS substrates. In this paper, a 3 dB 90deg directional coupler using WL-CSP technology is investigated. Algebraic comparison of simulation results with measurement results are performed, which express the same tendency. The coupler has insertion loss of -0.5 dB, isolation of -29.8 dB and VSWR of 1.2 in the measurement results. The WL-CSP coupler has almost the same characteristics as those fabricated on GaAs and Al2O3 substrates. The WL-CSP technology contributes to realize low-loss RF passive devices on Si CMOS chip, which is indispensable to achieve small-size, low-price and low-power-consumption RF circuits

Published in:

Digest of Papers. 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems

Date of Conference:

18-20 Jan. 2006