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Diagnosis and analysis of an analog circuit failure using time resolved emission microscopy

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4 Author(s)
Syed, A. ; Credence Syst. Corp., San Jose, CA ; Herlein, R. ; Cain, B. ; Sauk, F.

Acquiring the waveforms of internal nodes in an operating integrated circuit has been a key technique in understanding and resolving design and process related anomalies for many years. Time resolved emission (TRE) has emerged as a technique of choice for acquiring waveforms from the backside of digital ICs. This paper describes the techniques used for diagnosing an analog level problem in a mixed signal IC, employing a TRE system as the main debugging tool. This debug effort is significant in the sense that a backend failure analysis tool that is typically dedicated to digital circuits was used for the first time to successfully diagnose an analog fault on an asynchronous timing path. A design-for-debug strategy adopted early in the design cycle proved to be important in allowing timely TRE failure analysis resolution of this device

Published in:

Test Conference, 2005. Proceedings. ITC 2005. IEEE International

Date of Conference:

8-8 Nov. 2005

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