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A test point selection method for data converters using Rademacher functions and wavelet transforms

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2 Author(s)
C. Carter ; Texas Instruments Inc., Dallas, TX, USA ; S. Ang

A new test method of linearity errors for data converters is presented. Based in principle of the test point selection (NIST) method, this test method combines Rademacher functions and wavelet transforms to create a linearity error model for the data converter. Test results from an analog-to-digital converter and a digital-to-analog converter are presented and compared to other reported methods

Published in:

IEEE International Conference on Test, 2005.

Date of Conference:

8-8 Nov. 2005