By Topic

Q-factor measurement of quasi-optical dielectric resonators under conditions of the whispering gallery mode degeneration removal

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
A. A. Barannik ; Inst. of Radiophys. & Electron., Nat. Acad. of Sci., Kharkiv, Ukraine ; N. T. Cherpak ; D. E. Chuyko

An approach that allows one to determine the unloaded quality factor of a quasi-optical dielectric resonator (QDR) under conditions of the resonance line splitting corresponding to twofold degenerative whispering gallery (WG) mode has been proposed. The resonator is represented by an equivalent network as two oscillatory circuits with a certain coupling between them. The approach allows one to determine the Q-factor of a single oscillatory circuit using three measured parameters, namely: 1) ratio between specific amplitudes of the resonator amplitude-frequency response (or its second derivative); 2) resonant frequency; and 3) frequency splitting of the response (or its respective second derivative). The proposed technique is illustrated by the measurements in the millimeter-wave range for sapphire quasi-optical resonators with conducting and high-Tc superconducting (HTS) film endplates.

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:55 ,  Issue: 1 )