By Topic

Automatic profiling of a steady state temperature field in thermochemical systems and devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ostrowski, P. ; Fac. of Electr. Eng., Warsaw Tech. Univ., Poland ; Lobodzinski, W. ; Skorek, A.

This article presents a method of the steady state temperature profiling in the case of industrial thermochemical systems. A problem of this type represents an important element of the production processes in different industrial area such as material engineering, manufacturing of semiconductor devices, very large scale integration (VLSI) systems, monocrystals growth, etc. The proposed method is oriented toward the automation of the profiling process, allowing to significantly reduce the duration of this operation. The paper covers the theoretical basis of the method as well as examples of industrial applications.

Published in:

Industry Applications, IEEE Transactions on  (Volume:42 ,  Issue: 1 )