By Topic

Reliability of tunneling magnetoresistance recording head-lifetime, failure mode, and production screening

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Pak-Kin Wong ; SAE Technol. Center, SAE Magnetics Ltd, Shatin, China ; Inage, K. ; Lai, A.W.Y. ; Leung, E.C.W.
more authors

We have studied the behavior of failure in lifetime acceleration test of TMR prototype with performance meeting 100 Gb/in2 recording. The failure mode is identified to be same as extrinsic breakdown of the AlOx barrier, while failure due to magnetic change is not observed. The extrinsic breakdown is further found to be the increase in pinhole conduction in the barrier, involving thermal energy from ambient and read current. Results also suggest the existence of a critical voltage below which pinhole is not enlarged. Furthermore, we will discuss our hypothesis in the formation of pinholes and the role of charge traps in the barrier. Finally, we will discuss a method for screening out heads with relatively short lifetime, which is feasible for mass production. The screening allows a guarantee of lifetime well enough for drive application.

Published in:

Magnetics, IEEE Transactions on  (Volume:42 ,  Issue: 2 )