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Analysis of mode quality factors and mode reflectivities for nanowire cavity by FDTD technique

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4 Author(s)
Miao-Qing Wang ; State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China ; Yong-Zhen Huang ; Chen, Qin ; Zhi-Ping Cai

The mode frequency and the quality factor of nanowire cavities are calculated from the intensity spectrum obtained by the finite-difference time-domain (FDTD) technique and the Pade´ approximation. In a free-standing nanowire cavity with dielectric constant ε=6.0 and a length of 5 μm, quality factors of 130, 159, and 151 are obtained for the HE11 modes with a wavelength around 375 nm, at cavity radius of 60, 75, and 90 nm, respectively. The corresponding quality factors reduce to 78, 94, and 86 for a nanowire cavity standing on a sapphire substrate with a refractive index of 1.8. The mode quality factors are also calculated for the TE01 and TM01 modes, and the mode reflectivities are calculated from the mode quality factors.

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Quantum Electronics, IEEE Journal of  (Volume:42 ,  Issue: 2 )