Scheduled System Maintenance:
On May 6th, single article purchases and IEEE account management will be unavailable from 8:00 AM - 5:00 PM ET (12:00 - 21:00 UTC). We apologize for the inconvenience.
By Topic

Genetic algorithm based methodology for breaking the steganalytic systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yi-Ta Wu ; Comput. Vision Lab., New Jersey Inst. of Technol., Newark, NJ, USA ; Shih, F.Y.

Steganalytic techniques are used to detect whether an image contains a hidden message. By analyzing various image features between stego-images (the images containing hidden messages) and cover-images (the images containing no hidden messages), a steganalytic system is able to detect stego-images. In this paper, we present a new concept of developing a robust steganographic system by artificially counterfeiting statistic features instead of the traditional strategy by avoiding the change of statistic features. We apply genetic algorithm based methodology by adjusting gray values of a cover-image while creating the desired statistic features to generate the stego-images that can break the inspection of steganalytic systems. Experimental results show that our algorithm can not only pass the detection of current steganalytic systems, but also increase the capacity of the embedded message and enhance the peak signal-to-noise ratio of stego-images.

Published in:

Systems, Man, and Cybernetics, Part B: Cybernetics, IEEE Transactions on  (Volume:36 ,  Issue: 1 )