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Effect of resonant cavity in wafer-bonded Green InGaN LED with dielectric and silver mirrors

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4 Author(s)
Ray-Hua Horng ; Inst. of Precision Eng., Nat. Chung Hsing Univ., Taichung ; Wei-Kai Wang ; Shin-Yung Huang ; Dong-Sing Wuu

The green InGaN-based resonant cavity light-emitting diodes (RCLEDs) on Si substrates were fabricated using laser liftoff and wafer bonding techniques. Five-pair TiO2--SiO2 distributed Bragg reflectors (reflectivity: 85%) and an Ag metal layer (reflectivity: 99%) were employed as the top and bottom mirrors, respectively. The light output power of the RCLED at room temperature is 1.5 times the magnitude of a similar structure without a resonant cavity at an injecting current density of 600A/cm2. The mode spectrum exhibits a line width of approximately 5.5 nm at the dominant peak wavelength of 525 nm, which indicates a quality factor of 100. Under various injection current densities, a low thermally induced red shift in the 525-nm emission peak was observed. This indicates that the resonant microcavity effect contributes to the stability of electroluminescence emission wavelength

Published in:

Photonics Technology Letters, IEEE  (Volume:18 ,  Issue: 3 )

Date of Publication:

Feb. 1, 2006

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