Close category search window
 

An SVD-based grayscale image quality measure for local and global assessment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

The important criteria used in subjective evaluation of distorted images include the amount of distortion, the type of distortion, and the distribution of error. An ideal image quality measure should, therefore, be able to mimic the human observer. We present a new grayscale image quality measure that can be used as a graphical or a scalar measure to predict the distortion introduced by a wide range of noise sources. Based on singular value decomposition, it reliably measures the distortion not only within a distortion type at different distortion levels, but also across different distortion types. The measure was applied to five test images (airplane, boat, Goldhill, Lena, and peppers) using six types of distortion (JPEG, JPEG 2000, Gaussian blur, Gaussian noise, sharpening, and DC-shifting), each with five distortion levels. Its performance is compared with PSNR and two recent measures.

Published in:
Image Processing, IEEE Transactions on  (Volume:15 ,  Issue: 2 )

Date of Publication: Feb. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.