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Analysis of DC current accelerated life tests of GaN LEDs using a Weibull-based statistical model

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4 Author(s)
S. Levada ; Dept. of Inf. Eng., Univ. of Padova, Italy ; M. Meneghini ; G. Meneghesso ; E. Zanoni

Gallium-nitride-based light-emitting diode (LED) accelerated life tests were carried out over devices adopting two different packaging schemes (i.e., with plastic transparent encapsulation or with pure metallic package). Data analyses were done using a Weibull-based statistical description with the aim of estimating the effect of high current on device performance. A consistent statistical model was found with the capability to estimate the mean time to failure (MTTF) of devices during DC current stress and the accelerating factors of high current stresses.

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IEEE Transactions on Device and Materials Reliability  (Volume:5 ,  Issue: 4 )