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This paper reports on an investigation on the light-current, relative intensity noise, and chirp variations of life-tested InGaAsP/InP multiquantum-well buried heterostructure (BH) laser diodes (LDs). The devices have been stressed at highly accelerated aging conditions (I=170 mA, T=140°C for 3000 h). Typically, the operating current at constant output optical power (Iop) increases logarithmically with time in stable devices while the noise resonance frequency remains stable. High-frequency RF signal-induced chirp for relative stable LDs at constant output power shows very little change with time.