IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Lasers and Electro-Optics, 20 ... Help

Stabilized two-center holographic recording in doped LiNbO3 crystals

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Momtahan, O. ; Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA ; Cadena, G. ; Adibi, A.

A congruently grown LiNbO3:Fe:Mn crystal with high Fe concentrations is experimentally tested to show the improvement in M/# and sensitivity. Particularly, the variation of sensitivity versus recording and sensitizing intensities is investigated in detail.

Published in:
Lasers and Electro-Optics, 2005. (CLEO). Conference on  (Volume:3 )

Date of Conference: 22-27 May 2005

Page(s):
2212 - 2214 Vol. 3
Print ISBN:
1-55752-795-4
INSPEC Accession Number:
8733875
Digital Object Identifier :
10.1109/CLEO.2005.202420
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.