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Profilometry using a frequency-shifted feedback laser

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3 Author(s)
Ndiaye, C. ; Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan ; Hara, T. ; Ito, Hiromasa

A frequency-shifted feedback laser is used as chirped light source for optical profilometry based on optical frequency-domain reflectometry. Measurement ranges of 1 m and accuracies better than 50 μm have been demonstrated.

Published in:

Lasers and Electro-Optics, 2005. (CLEO). Conference on  (Volume:3 )

Date of Conference:

22-27 May 2005