Cart (Loading....) | Create Account
Close category search window
 

Flexible Microscope Calibration using Virtual Pattern for 3-D Telemicromanipulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ammi, M. ; Laboratoire Vision et Robotique, Université d’Orléans 10 bd Lahitolle, 18020 Bourges Cedex, France; Email: mehdi. ammi@ensi-bourges.fr ; Fremont, V. ; Ferreira, A.

In the context of virtualized reality based telemicromanipulation, we present in this paper a visual calibration technique for optical microscope coupled with a CCD camera. In contrast to previous approaches, a virtual calibration pattern is constructed using the micromanipulator with a sub-pixel localization in the image. We also present a new camera calibration algorithm based on Parallel Single-Plane properties. The proposed procedure leads to a linear system from which the solution gives directly both intrinsic and extrinsic parameters of the geometrical model. Both computer simulation and real data have been used to test the proposed technique, and very good results have been obtained. Compared with classical techniques, our method provides an alternative technical solution, easy to use and flexible in the context of micromanipulation and virtual reality.

Published in:

Robotics and Automation, 2005. ICRA 2005. Proceedings of the 2005 IEEE International Conference on

Date of Conference:

18-22 April 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.