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Measurement of linewidth enhancement factor variations in external cavity semiconductor lasers

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3 Author(s)
G. Giuliani ; Dipartimento di Elettronica, Pavia Univ., Italy ; S. Donati ; W. Elssser

This paper deals with linewidth enhancement factor measurements performed with a new method based on the self-mixing optical feedback interference effect capable of measuring the α value in operating conditions above threshold. Measurements are performed on a commercial ECL in Littman configuration, emitting 40 mW maximum power, with wavelength tunable between 830 and 870 nm.

Published in:

EQEC '05. European Quantum Electronics Conference, 2005.

Date of Conference:

12-17 June 2005