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Guest Editor's Introduction: Reliability-Aware Microarchitecture

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2 Author(s)
Adve, S.V. ; University of Illinois at Urbana-Champaign ; Sanda, P.

This special issue of IEEE Micro addresses the trends toward reliability-aware microarchitecture, their system-level implications, and some innovative ideas on how to build systems in the face of those challenges.

Published in:

Micro, IEEE  (Volume:25 ,  Issue: 6 )