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Evaluation and improvement of fault coverage of conformance testing by UIO sequences

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2 Author(s)
Lombardi, F. ; Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA ; Shen, Y.-N.

The fault coverage of testing protocols using unique input/output (UIO) sequences is analyzed. UIO sequences can be efficiently employed in checking the conformance specifications of protocols by using transition testing. The test sequence is found using the rural Chinese postman tour algorithm. A comprehensive fault model is developed, and analytical expressions are given for the fault coverage. The conditions for undetectability are analyzed, and a new algorithm is proposed. Simulation results and illustrative examples are presented. Overhead issues are discussed, and significant improvements are shown for achieving 100% fault coverage. The major advantage of the proposed approach is that it provides the theoretical basis for fault coverage evaluation of protocol testing using UIO sequences

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Communications, IEEE Transactions on  (Volume:40 ,  Issue: 8 )