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Diagnostics of dielectric parameters of two-layer structures by means of open resonators in the millimeter wave-band

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2 Author(s)
Afonin, D.G. ; Fac. of Phys., Moscow State Univ. ; Kanunov, E.R.

The principles of measurement of UHF parameters of two-layer structures: the dielectric permittivity (epsiv) and the loss tangent (tgdelta) using open resonators are presented. These principles are based on the measurement of open resonator characteristics-the Q-factor and the resonance frequency-when putting the sample under investigation into the resonance volume

Published in:

Microwave & Telecommunication Technology, 2005 15th International Crimean Conference  (Volume:2 )

Date of Conference:

16-16 Sept. 2005