By Topic

Diagnostics of dielectric parameters of two-layer structures by means of open resonators in the millimeter wave-band

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Afonin, D.G. ; Fac. of Phys., Moscow State Univ. ; Kanunov, E.R.

The principles of measurement of UHF parameters of two-layer structures: the dielectric permittivity (epsiv) and the loss tangent (tgdelta) using open resonators are presented. These principles are based on the measurement of open resonator characteristics-the Q-factor and the resonance frequency-when putting the sample under investigation into the resonance volume

Published in:

Microwave & Telecommunication Technology, 2005 15th International Crimean Conference  (Volume:2 )

Date of Conference:

16-16 Sept. 2005