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Scanning near-field optical microscope probes: fabrication and properties

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1 Author(s)
Dryakhlushin, V.F. ; Inst. for Phys. of Microstruct., Russian Acad. of Sci., Nizhny Novgorod

The method of scanning near-field optical microscope (SNOM) probe fabrication with high transmission coefficients on the base of tapered single-mode optical fiber are studied. The various methods of improvement of resolution of SNOM and application for modification and diagnostics of sample surface are discussed

Published in:

Microwave & Telecommunication Technology, 2005 15th International Crimean Conference  (Volume:2 )

Date of Conference:

16-16 Sept. 2005

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