Close category search window
 

Zero-time enterprise modeling with component assembly and process model optimization techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wenan Tan ; Software Eng. Inst., Zhejiang Univ., Hangzhou, China ; Song Li ; Fan Yang

This paper presents a zero-time enterprise modeling method using component assembly and process model optimization techniques. The proposed method supports the application systems built on enterprise model with the dynamic-reconstructing ability to respond to market quickly. Using the proposed approach, customized enterprise model can be constructed rapidly by component assembly techniques with component base and industrial reference model; and enterprise business process model can be reengineered and optimized based on business process dynamic optimization techniques including process definition, simulation, optimization and enactment.

Published in:
Computer and Information Technology, 2005. CIT 2005. The Fifth International Conference on

Date of Conference: 21-23 Sept. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.