Cart (Loading....) | Create Account
Close category search window
 

Global segmentation and curvature analysis of volumetric data sets using trivariate B-spline functions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Soldea, O. ; Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel ; Elber, G. ; Rivlin, E.

This paper presents a method to globally segment volumetric images into regions that contain convex or concave (elliptic) iso-surfaces, planar or cylindrical (parabolic) iso-surfaces, and volumetric regions with saddle-like (hyperbolic) iso-surfaces, regardless of the value of the iso-surface level. The proposed scheme relies on a novel approach to globally compute, bound, and analyze the Gaussian and mean curvatures of an entire volumetric data set, using a trivariate B-spline volumetric representation. This scheme derives a new differential scalar field for a given volumetric scalar field, which could easily be adapted to other differential properties. Moreover, this scheme can set the basis for more precise and accurate segmentation of data sets targeting the identification of primitive parts. Since the proposed scheme employs piecewise continuous functions, it is precise and insensitive to aliasing.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:28 ,  Issue: 2 )

Date of Publication:

Feb. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.