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Self-assembled nano-fabrication processes yield regular and reconfigurable devices. However, defect densities in this emerging nanotechnology are higher than those in conventional lithography-based VLSI. In this paper, we present a defect-tolerant design flow to minimize customized post-fabrication design efforts to be performed per chip. We also present a greedy O(n log n) mapping algorithm which makes the connection between defect-unaware design steps and the final defect-aware step. Experiments show that the results obtained by this algorithm are very close to the exact solutions.
Date of Conference: 6-10 Nov. 2005