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Improvement of the fault coverage of the pseudo-random phase in column-matching BIST

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2 Author(s)
Fiser, P. ; Dept. of Comput. Sci. & Eng., Czech Tech. Univ., Prague, Czech Republic ; Kubatova, H.

Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of faults should be detected by the pseudo-random phase, to reduce the number of faults to be covered in the deterministic one. We study the properties of different pseudo-random pattern generators. Their successful ness in fault covering strictly depends on the tested circuit. We examine properties of LFSRs and cellular automata. Four methods enhancing the pseudo-random fault coverage have been proposed. Then we propose a universal method to efficiently compute test weights. The observations are documented on some of the standard ISCAS benchmarks and the final BIST circuitry is synthesized using the column-matching method.

Published in:

Digital System Design, 2005. Proceedings. 8th Euromicro Conference on

Date of Conference:

30 Aug.-3 Sept. 2005

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