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Skin-effect considerations on transient response of a transmission line excited by an electromagnetic pulse

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2 Author(s)
Mok, E.S.M. ; Ottawa Univ., Ont., Canada ; Costache, G.I.

The electromagnetic pulse can cause degradation of modern digital and analog devices. Many analytical models have been used extensively to study the susceptibility of equipment related to EMI/EMC (electromagnetic interference/electromagnetic compatibility) engineering, but the emphasis has been mainly on lossless transmission lines. This work takes into account the transient skin-effect of a transmission line exposed to a time-varying electromagnetic field. Beginning with the classical transmission line theory, the transient skin-effect of a transmission line and the equivalent sources due to the external fields are incorporated. As a result, an integral-differential equation is derived. By using the finite-difference-time-domain (FD-TD) approach, the induced voltages onto the line are predicted. There is also a discussion of the numerical approach and the propagation of the predicted induced voltage

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:34 ,  Issue: 3 )

Date of Publication:

Aug 1992

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