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Photon counting pixels in CMOS technology for medical X-ray imaging applications

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3 Author(s)
A. H. Goldan ; Simon Fraser Univ., Burnaby, BC, Canada ; K. S. Karim ; J. A. Rowlands

Crystalline silicon (c-Si) technology is attractive for advanced large area imaging applications because of higher transistor mobility, smaller feature sizes and higher density of integration. These benefits of c-Si technology can help expedite the development of high performance circuitry required for better contrast, lower noise, and lower X-ray dose while providing small, high-resolution pixels. In this research, we examine the technology requirements of performing digital mammography tomosynthesis, an advanced diagnostic X-ray imaging modality, using c-Si semiconductor technology. We then present a novel photon counting pixel architecture in CMOS 0.18 mum c-Si technology to address the requirements posed by mammography tomosynthesis

Published in:

Canadian Conference on Electrical and Computer Engineering, 2005.

Date of Conference:

1-4 May 2005