By Topic

Algebraic approaches for fault identification in discrete-event systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yingquan Wu ; Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA ; Hadjicostis, C.N.

In this note, we develop algebraic approaches for fault identification in discrete-event systems that are described by Petri nets. We consider faults in both Petri net transitions and places, and assume that system events are not directly observable but that the system state is periodically observable. The particular methodology we explore incorporates redundancy into a given Petri net in a way that enables fault detection and identification to be performed efficiently using algebraic decoding techniques. The guiding principle in adding redundancy is to keep the number of additional Petri net places small while retaining enough information to be able to systematically detect and identify faults when the system state becomes available. The end result is a redundant Petri net embedding that uses 2k additional places and enables the simultaneous identification of 2k-1 transition faults and k place faults (that may occur at various instants during the operation of the Petri net). The proposed identification scheme has worst-case complexity of O(k(m+n)) operations where m and n are respectively the number of transitions and places in the given Petri net.

Published in:

Automatic Control, IEEE Transactions on  (Volume:50 ,  Issue: 12 )