By Topic

Low-noise magnetic force microscopy with high resolution by tip cooling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
H. Saito ; Dept. of Mater. Sci. & Eng., Akita Univ., Japan ; R. Sunahara ; Y. Rheem ; S. Ishio

Low-noise magnetic force microscopy (MFM) was realized by using a conventional high-vacuum MFM with homemade tip-cooling equipment. The noise level of the MFM at a tip temperature of 130 K was estimated at μN/m order. High spatial resolution of 10 nm was obtained for observing high-density recording media with recording density of 1000 kfci. The improvement of resolution by tip cooling was a result of the reduction of thermodynamic noise of a cantilever and the effective reduction of tip-sample distance due to the magnetic hardening of a tip.

Published in:

IEEE Transactions on Magnetics  (Volume:41 ,  Issue: 12 )